Development of method to forecast soybean leaf damage by common cutworm using entomological radar and searchlight trap-Reference-Cited by-同舟云学术

Development of method to forecast soybean leaf damage by common cutworm using entomological radar and searchlight trap

Published:2019-10-03 Issue:21 Volume:2019 Page:7531-7533
ISSN:2051-3305
Container-title:The Journal of Engineering
language:en
Short-container-title:J. eng.

Author:

Otuka Akira¹^ORCID,Matsumura Masaya²,Tokuda Makoto³

Affiliation:

1. Institute of Agricultural Machinery, National Agriculture and Food Research OrganizationTsukubaJapan

2. Kyushu Okinawa Agricultural Research Center, National Agriculture and Food Research OrganizationKoshiJapan

3. Faculty of AgricultureSaga UniversitySagaJapan

Publisher

Institution of Engineering and Technology (IET)

Subject

General Engineering,Energy Engineering and Power Technology,Software

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/joe.2019.0597

Reference5 articles.

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2. Development of vertical‐looking radar technology for monitoring insect migration;Chapman J.W.;Comput. Electron. Agric.,2002

3. Recent insights from radar studies of insect flight;Chapman J.W.;Annu. Rev. Entomol.,2011

4. Insect monitoring radar: analytical time‐domain algorithm for retrieving trajectory and target parameters;Harman I.T.;Comput. Electron. Agric.,2004

5. AldhousA.: ‘An investigation of the polarisation dependence of insect radar cross sections at constant aspect’. PhD thesis Cranfield Institute of Technology 1989 pp.1–139

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