Subject
Management of Technology and Innovation,Physics and Astronomy (miscellaneous),Engineering (miscellaneous)
Reference18 articles.
1. X. Xu, W. Huang, "Constrained Optimal Designs for Step-stress Accelerated Life Testing Experiments" Proceedings of the 3rd IEEE International Conference on Cloud Computing and Big Data Analysis, 2018, 633-638.
2. X. Xu, S. Hunt, "Robust Designs of Step-Stress Accelerated Life Testing Experiments for Reliability Prediction" Matematika, 29(1), 203-212, 2013.
3. R. Miller, W. Nelson, "Optimum Simple Step-Stress Plans for Accelerated Life Testing" IEEE Transactions in Reliability, 32(1), 59-65, 1983.
4. D. S. Bai, M. S. Kim, S. H. Lee, "Optimum simple step-stress accelerated life tests with censoring" IEEE Transactions in Reliability, 38(5), 528-532, 1989.
5. D. S. Bai, M. S. Kim, "Optimum simple step-stress accelerated life tests for Weibull distribution and Type-I censoring" Naval Research Logistics, 40(2), 193-210, 1993.