Optimum simple step-stress accelerated life tests for weibull distribution and type I censoring
Author:
Publisher
Wiley
Subject
Management Science and Operations Research,Ocean Engineering,Modeling and Simulation
Reference23 articles.
1. Optimum simple step-stress accelerated life-tests with competing causes of failure
2. and , “Optimal Design of Partially Accelerated Life Tests for the Exponential Distribution under Type I Censoring,” IEEE Transactions on Reliability, (to be published).
3. Optimum simple step-stress accelerated life tests with censoring
4. A tampered failure rate model for step-stress accelerated life test
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