Efficiency analysis and promising applications of silicon drift detectors

Abstract

Silicon drift detectors (SDDs) stand as a groundbreaking technology with a diverse range of applications, particularly in the fields of physics and medical imaging. This paper provides an analysis of the performance of SDDs as detectors for X-ray radiation measurement, shedding light on their exceptional capabilities and potential in medical imaging. Compared to conventional detectors, SDDs have several notable advantages. Their high efficiency in capturing X-rays allows them to provide outstanding sensitivity and accuracy in detecting even low-energy X-rays. In addition, SDDs exhibit significantly low electronic-noise levels, contributing to better signal-to-noise ratio and better data quality. Furthermore, their high resolution enables exact spatial localization of radiation sources, which is essential for accurate diagnosis. This research is devoted to the evaluation of efficiency and potential application of SDDs in X-ray spectroscopy, with particular emphasis on their application in medical imaging. We focus on evaluating the performance characteristics of SDDs, such as their linearity, stability and sensitivity in detecting X-rays. The aim is to highlight the suitability of SDDs for a wide range of applications.