X-ray based methods for non-destructive testing and material characterization

Author:

Hanke Randolf,Fuchs Theobald,Uhlmann Norman

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference6 articles.

1. K. Stierstorfer, M. Spahn, Self-normalizing method to measure the detective quantum efficiency of a wide range of X-ray detectors, Med. Phys. (1999) 26; Am. Assoc. Phys. Med. (1999) 1312.

2. Image processing for inline digital industrial radiology;Hanke;J. Nondestruct. Eval., Indian Soc. NDT (India),2001

3. A new radioscopic system for post cast perfection;Hanke;Foundry Trade J.,2002

4. T. Wenzel, R. Hanke, Texture analysis for classification of cast defects in X-ray images, Second Workshop on NDT in Progress, Prag, 2003.

5. R. Hanke, Microanalysis by volume computed tomography, in: G.I.T. Imaging & Microscopy, April 2003, pp. 40–43.

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