Frequency dispersion of capacitance–voltage characteristics in wide bandgap semiconductor-electrolyte junctions
Author:
Funder
IAP RAS
Publisher
IOP Publishing
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0268-1242/31/i=12/a=125013/pdf
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1. Photoelectrochemical capacitance-voltage measurements of 4H-SiC
2. Electrochemical C-V Profiling of P-type 6H-SiC
3. On application of electrochemical capacitance–voltage profiling technique for n-type SiC
4. Electrochemical Etching and CV-Profiling of GaN
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