SONOS memories with embedded silicon nanocrystals in nitride-Reference-Cited by-同舟云学术

SONOS memories with embedded silicon nanocrystals in nitride

Published:2008-05-28 Issue:7 Volume:23 Page:075033
ISSN:0268-1242
Container-title:Semiconductor Science and Technology
language:
Short-container-title:Semicond. Sci. Technol.

Author:

Liu Mei-Chun,Chiang Tsung-Yu,Kuo Po-Yi,Chou Ming-Hong,Wu Yi-Hong,You Hsin-Chiang,Cheng Ching-Hwa,Liu Sheng-Hsien,Yang Wen-Luh,Lei Tan-Fu,Chao Tien-Sheng

Publisher

IOP Publishing

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference15 articles.

1. On the go with SONOS

2. A true single-transistor oxide-nitride-oxide EEPROM device

3. Gate layout and bonding pad structure of a RF n-MOSFET for low noise performance

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