Subject
Condensed Matter Physics,General Materials Science
Cited by
20 articles.
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1. LEEM, SPLEEM and SPELEEM;Springer Handbook of Microscopy;2019
2. Spin-dependent phase shift at ferromagnetic film interfaces from the reflectivity of slow electrons;Physical Review B;2017-11-06
3. Inelastic effects in low-energy electron reflectivity of two-dimensional materials;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2015-03
4. Intensity-voltage low-energy electron microscopy for functional materials characterization;physica status solidi (RRL) - Rapid Research Letters;2014-05-15
5. Applications in Surface Science;Surface Microscopy with Low Energy Electrons;2014