Intensity-voltage low-energy electron microscopy for functional materials characterization
Author:
Funder
Spanish Ministerio de Ciencia e Innovación
Publisher
Wiley
Subject
Condensed Matter Physics,General Materials Science
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssr.201409102/fullpdf
Reference142 articles.
1. Low energy electron microscopy
2. A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design
3. A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results
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