A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference12 articles.
1. A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design
2. Micrometer-scale band mapping of single silver islands in real and reciprocal space
3. Surface Plasmon Microscopy Using an Energy-Filtered Low Energy Electron Microscope
4. Low-energy electron microscopy and spectroscopy with ESCHER: Status and prospects
5. Medipix 2 detector applied to low energy electron microscopy
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