Raman imaging of semiconductor materials: characterization of static and dynamic properties
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Link
http://stacks.iop.org/0953-8984/16/i=2/a=004/pdf
Reference55 articles.
1. Microscopic mapping of strain relaxation in uncoalesced pendeoepitaxial GaN on SiC
2. Strain imaging analysis of Si using Raman microscopy
3. Raman imaging of stress in a SiGe/Si photoelastic optical channel waveguide structure
4. Mapping of local stress distributions in SiGe/Si optical channel waveguide
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