Author:
Virojanadara C,Johansson L I
Subject
Condensed Matter Physics,General Materials Science
Cited by
6 articles.
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1. Industrial Applications;X-Ray Absorption and X-Ray Emission Spectroscopy;2016-01-22
2. Passivation of SiC device surfaces by aluminum oxide;IOP Conference Series: Materials Science and Engineering;2014-03-31
3. Chemical characterization of SiO2/SiC interface after nitridation treatment;Journal of Electron Spectroscopy and Related Phenomena;2011-04
4. Silicon Dioxide–Silicon Carbide Interfaces;Defects in Microelectronic Materials and Devices;2008-11-19
5. Nitridation anisotropy in SiO2∕4H–SiC;Journal of Applied Physics;2005-04