Aspects of lateral resolution in energy-filtered core level photoelectron emission microscopy
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Link
http://stacks.iop.org/0953-8984/21/i=31/a=314002/pdf
Reference22 articles.
1. The resolution of photoelectron microscopes with UV, X-ray, and synchrotron excitation sources
2. The possibilities for analytical methods in photoemission and low-energy microscopy
3. XPEEM WITH ENERGY-FILTERING: ADVANTAGES AND FIRST RESULTS FROM THE SMART PROJECT
4. Recent advances in chemical and magnetic imaging of surfaces and interfaces by XPEEM
5. Core-level photoelectron spectroscopy from individual heteroepitaxial nanocrystals on GaAs(001)
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1. Summary of ISO/TC 201 International Standard ISO 18516:2019 Surface chemical analysis—Determination of lateral resolution and sharpness in beam‐based methods with a range from nanometres to micrometres and its implementation for imaging laboratory X‐ray photoelectron spectrometers (XPS);Surface and Interface Analysis;2021-10-22
2. A Simplified Method for Patterning Graphene on Dielectric Layers;ACS Applied Materials & Interfaces;2021-07-30
3. Vector Potential Photoelectron Microscopy Instrument Design;Ultramicroscopy;2020-08
4. Erratum to: Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards;Analytical and Bioanalytical Chemistry;2015-02-21
5. Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards;Analytical and Bioanalytical Chemistry;2014-09-12
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