Ellipsometric and Raman spectroscopic study of nanocrystalline silicon thin films prepared by a rf magnetron sputtering technique
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Link
http://stacks.iop.org/0953-8984/20/i=44/a=445221/pdf
Reference28 articles.
1. Toward the fast deposition of highly crystallized microcrystalline silicon films with low defect density for Si thin-film solar cells
2. Highly conductive and highly transparent n-type microcrystalline silicon thin films
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4. Material and solar cell research in microcrystalline silicon
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