Abstract
Abstract
Optically pumped whispering gallery mode (WGM) lasing has been observed in many freestanding microdisk structures. Dry etching is normally used to fabricate the microdisks, which causes severe sidewall damage, resulting in degradation of lasing performance, especially for ultra-small electrically-injected devices. In this paper, we demonstrate high quality microdisk cavities with 3.5 µm diameter, by combining a selective overgrowth approach and an epitaxial lattice-matched distributed Bragg reflector (DBR), topped with a highly reflective (>99%) dielectric DBR. InGaN polaritons are found to occur in the high-quality microcavities. WGM modes are measured, with the positions in good agreement with finite difference time domain simulations. Furthermore, lasing behaviour is observed with a threshold at 410 µW and a dominant mode at 488 nm.
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference31 articles.
1. Electrically injected GaN-based microdisk towards an efficient whispering gallery mode laser;Mei;Opt. Express,2021
2. Beyond solid-state lighting: miniaturization, hybrid integration, and applications of GaN nano- and micro-LEDs;Wasisto;Appl. Phys. Rev.,2019
3. Ultra-low threshold green InGaN quantum dot microdisk lasers grown on silicon;Zhao;Appl. Phys. Lett.,2020
4. Ultrasmall, ultracompact and ultrahigh efficient InGaN micro light emitting diodes μLEDs) with narrow spectral line width;Bai;ACS Nano,2020
5. Free-standing, optically pumped, GaN/InGaN microdisk lasers fabricated by photoelectrochemical etching;Haberer;Appl. Phys. Lett.,2004
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