Quantitative and simultaneous analysis of the polarity of polycrystalline ZnO seed layers and related nanowires grown by wet chemical deposition-Reference-Cited by-同舟云学术

Quantitative and simultaneous analysis of the polarity of polycrystalline ZnO seed layers and related nanowires grown by wet chemical deposition

Published:2017-01-30 Issue:9 Volume:28 Page:095704
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Guillemin Sophie,Parize Romain,Carabetta Joseph,Cantelli Valentina,Albertini David,Gautier Brice,Brémond Georges,Fong Dillon D,Renevier Hubert,Consonni Vincent

Funder

LABEX CEMAM

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/28/i=9/a=095704/pdf

Reference66 articles.

1. Polarity in GaN and ZnO: Theory, measurement, growth, and devices

2. The chemistry and physics of zinc oxide surfaces

3. Zn- and O-face polarity effects at ZnO surfaces and metal interfaces

4. Asymmetry in the excitonic recombinations and impurity incorporation of the two polar faces of homoepitaxially grown ZnO films

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