Focused electron-beam-induced deposition for fabrication of highly durable and sensitive metallic AFM-IR probes
Author:
Publisher
IOP Publishing
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering
Link
http://iopscience.iop.org/article/10.1088/1361-6528/aac73c/pdf
Reference40 articles.
1. AFM-IR: Technology and Applications in Nanoscale Infrared Spectroscopy and Chemical Imaging
2. Nanoscale Infrared Spectroscopy: Improving the Spectral Range of the Photothermal Induced Resonance Technique
3. AFM–IR: Combining Atomic Force Microscopy and Infrared Spectroscopy for Nanoscale Chemical Characterization
4. Infrared Imaging and Spectroscopy Beyond the Diffraction Limit
5. Theory of infrared nanospectroscopy by photothermal induced resonance
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