Advanced techniques in automated high-resolution scanning transmission electron microscopy

Author:

Pattison Alexander JORCID,Pedroso Cassio C SORCID,Cohen Bruce EORCID,Ondry Justin CORCID,Alivisatos A PaulORCID,Theis WolfgangORCID,Ercius PeterORCID

Abstract

Abstract Scanning transmission electron microscopy is a common tool used to study the atomic structure of materials. It is an inherently multimodal tool allowing for the simultaneous acquisition of multiple information channels. Despite its versatility, however, experimental workflows currently rely heavily on experienced human operators and can only acquire data from small regions of a sample at a time. Here, we demonstrate a flexible pipeline-based system for high-throughput acquisition of atomic-resolution structural data using an all-piezo sample stage applied to large-scale imaging of nanoparticles and multimodal data acquisition. The system is available as part of the user program of the Molecular Foundry at Lawrence Berkeley National Laboratory.

Funder

U.S. Department of Energy

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

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