Author:
Zainudin M. F.,Hussin H.,Halim A. K.,Karim J.
Cited by
3 articles.
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1. SUIT: Secure Undervolting with Instruction Traps;Proceedings of the 29th ACM International Conference on Architectural Support for Programming Languages and Operating Systems, Volume 2;2024-04-27
2. The Optimizations of Dual-Threshold Independent-Gate FinFETs and Low-Power Circuit Designs;Journal of Circuits, Systems and Computers;2019-09-23
3. Investigation of Negative Bias Temperature Instability (NBTI) Effects on Standard Cell Library Circuits Performance;2019 IEEE Regional Symposium on Micro and Nanoelectronics (RSM);2019-08