Characterization of Bi and Fe co-doped PZT capacitors for FeRAM-Reference-Cited by-同舟云学术

Characterization of Bi and Fe co-doped PZT capacitors for FeRAM

Published:2010-02 Issue:4 Volume:11 Page:044402
ISSN:1468-6996
Container-title:Science and Technology of Advanced Materials
language:en
Short-container-title:Science and Technology of Advanced Materials

Author:

Cross Jeffrey S,Kim Seung-Hyun,Wada Satoshi,Chatterjee Abhijit

Publisher

Informa UK Limited

Subject

General Materials Science

Link

http://www.tandfonline.com/doi/pdf/10.1088/1468-6996/11/4/044402

Reference30 articles.

1. International Technology Road Map for Semiconductors2009 Edition, available on-line from ITRS web site or from International Sematech Inc., ITRS Department Austin, Texas, USA

2. FeRAM

3. Conduction at domain walls in oxide multiferroics

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