Epitaxial ZnO gate dielectrics deposited by RF sputter for AlGaN/GaN metal-oxide-semiconductor high-electron-mobility transistors
Author:
Publisher
IOP Publishing
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://iopscience.iop.org/article/10.1088/1361-6641/aa9b58/pdf
Reference24 articles.
1. GaN-Based RF Power Devices and Amplifiers
2. Normally off AlGaN/GaN HEMT on Si substrate with selectively dry-etched recessed gate and polarization-charge-compensation δ-doped GaN cap layer
3. A Compact 30-W AlGaN/GaN HEMTs on Silicon Substrate With Output Power Density of 8.1 W/mm at 8 GHz
4. High Performance AlGaN∕GaN HEMT with Lattice Matched ZnO Gate Interlayer
5. Basic Properties of ZnO, GaN, and Related Materials
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Epi-Gd2O3/AlGaN/GaN MOS HEMT on 150 mm Si wafer: A fully epitaxial system for high power application;Applied Physics Letters;2019-08-05
2. Recent Progress on High-Capacitance Polymer Gate Dielectrics for Flexible Low-Voltage Transistors;Advanced Functional Materials;2018-09-02
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