Review of radiation effects on ReRAM devices and technology-Reference-Cited by-同舟云学术

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Review of radiation effects on ReRAM devices and technology

Published:2017-07-04 Issue:8 Volume:32 Page:083002
ISSN:0268-1242
Container-title:Semiconductor Science and Technology
language:
Short-container-title:Semicond. Sci. Technol.

Author:

Gonzalez-Velo Yago,Barnaby Hugh J,Kozicki Michael N

Funder

Defense Threat Reduction Agency

Publisher

IOP Publishing

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0268-1242/32/i=8/a=083002/pdf

Reference113 articles.

1. Electrical phenomena in amorphous oxide films

2. Low‐Frequency Negative Resistance in Thin Anodic Oxide Films

3. Electroforming, Switching and Memory Effects in Oxide Thin Films

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