Stuck-at Faults in ReRAM Neuromorphic Circuit Array and their Correction through Machine Learning-Reference-Cited by-同舟云学术

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Stuck-at Faults in ReRAM Neuromorphic Circuit Array and their Correction through Machine Learning

Published:2024-05-08 Issue: Volume: Page:1-4
ISSN:
Container-title:2024 IEEE Latin American Electron Devices Conference (LAEDC)
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Author:

Sawal Vedant¹,Wong Hiu Yung¹

Affiliation:

1. San Jose State University,M-PAC Lab,San Jose,USA

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx8/10555569/10555588/10555838.pdf?arnumber=10555838

Reference24 articles.

1. On the Opportunities and Risks of Foundation Models;Bommasani

2. Estimation of energy consumption in machine learning

3. In-memory computing with resistive switching devices

4. Recent progress in analog memory-based accelerators for deep learning

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