Characterization of helium bubbles in Si by slow positron beam
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
http://stacks.iop.org/1742-6596/225/i=1/a=012032/pdf
Reference20 articles.
1. Helium desorption/permeation from bubbles in silicon: A novel method of void production
2. The annealing of helium-induced cavities in silicon and the inhibiting role of oxygen
3. Helium in silicon: Thermal-desorption investigation of bubble precursors
4. Evolution of Defect Profiles in He-Implanted Silicon Studied by Slow Positrons
5. Formation of vacancy clusters and cavities in He-implanted silicon studied by slow-positron annihilation spectroscopy
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1. Positron annihilation spectroscopy of defects in nuclear and irradiated materials- a review;Materials Characterization;2021-04
2. Elemental Characterization of the Topmost Atomic Layer of Surface Using Doppler Broadening Spectroscopy;Acta Physica Polonica A;2020-02
3. Properties of helium bubbles in covalent systems at the nanoscale: A combined numerical and experimental study;Physical Review B;2017-07-17
4. Numerical simulations and modeling of the stability of noble gas atoms in interaction with vacancies in silicon;Computational Materials Science;2014-12
5. Evolution and change of He bubbles in He-containing Ti films upon thermal treatment studied by small-angle X-ray scattering and transmission electron microscopy;Thin Solid Films;2014-05
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