Helium in silicon: Thermal-desorption investigation of bubble precursors-Reference-Cited by-同舟云学术

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Helium in silicon: Thermal-desorption investigation of bubble precursors

Published:1997-09-15 Issue:12 Volume:56 Page:7331-7338
ISSN:0163-1829
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Corni F.,Nobili C.,Ottaviani G.,Tonini R.,Calzolari G.,Cerofolini G. F.,Queirolo G.

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.56.7331/fulltext

Reference22 articles.

1. Helium desorption/permeation from bubbles in silicon: A novel method of void production

2. The annealing of helium-induced cavities in silicon and the inhibiting role of oxygen

3. Gettering of metals by He induced voids in silicon

4. Gettering of metals by voids in silicon

5. Relative free energies of Si surfaces

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3. Thermal Desorption of Argon Implanted into Gallium Arsenide;Advances in Science and Technology Research Journal;2022-10-01

4. Radiation-induced paramagnetic defects in porous silicon under He and Ar ion irradiation;Radiation Physics and Chemistry;2020-11

5. Termodesorpcja argonu implantowanego do germanu;PRZEGLĄD ELEKTROTECHNICZNY;2020-07-29

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