Self-consistent absorption correction for quantitative energy- dispersive X-ray spectroscopy of InGaN layers in analytical transmission electron microscopy-Reference-Cited by-同舟云学术

Self-consistent absorption correction for quantitative energy- dispersive X-ray spectroscopy of InGaN layers in analytical transmission electron microscopy

Published:2015-10-12 Issue: Volume:644 Page:012006
ISSN:1742-6588
Container-title:Journal of Physics: Conference Series
language:
Short-container-title:J. Phys.: Conf. Ser.

Author:

Walther T,Wang X

Publisher

IOP Publishing

Subject

General Physics and Astronomy

Link

http://stacks.iop.org/1742-6596/644/i=1/a=012006/pdf

Reference8 articles.

1. The quantitative analysis of thin specimens

2. Absorption correction and thickness determination using the ζ factor in quantitative X-ray microanalysis

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