Effective absorption correction for energy dispersive X-ray mapping in a scanning transmission electron microscope: analysing the local indium distribution in rough samples of InGaN alloy layers
Author:
Affiliation:
1. Department of Electronic and Electrical Engineering; University of Sheffield; North Campus; Sheffield UK
2. CIMAP; UMR 6252; CNRS-ENSICAEN-CEA-UCBN; Caen Cedex France
Publisher
Wiley
Subject
Histology,Pathology and Forensic Medicine
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/jmi.12643/fullpdf
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2. X-ray microanalysis;Duncumb;J. Microsc,1979
3. Electron Energy-Loss Spectroscopy in the Electron Microscope
4. Prediction of continuum intensity in energy-dispersive X-ray microanalysis;Fiori;Anal. Chem.,1976
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