Absorption correction and thickness determination using the ζ factor in quantitative X-ray microanalysis
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference26 articles.
1. The parameterless correction method in X-ray microanalysis
2. Simplification of X-ray absorption correction in thin-sample quantitative microanalysis
3. A new form of the extrapolation method for absorption correction in quantitative X-ray microanalysis with the analytical electron microscope
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