Author:
Horita Zenji,Sano Takeshi,Nemoto Minoru
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference17 articles.
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2. Simultaneous determination of composition and mass thickness of thin films by quantitative x-ray fluorescence analysis
3. Electron Microscopy and Analysis 1979;Morris;Inst. Phys. Conf. Ser.,1980
4. Quantitative Microanalysis with High Spatial Resolution;Porter,1981
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