Study of the radiation damage of Silicon Photo-Multipliers at the GELINA facility-Reference-Cited by-同舟云学术

Study of the radiation damage of Silicon Photo-Multipliers at the GELINA facility

Published:2014-04-04 Issue:04 Volume:9 Page:P04004-P04004
ISSN:1748-0221
Container-title:Journal of Instrumentation
language:
Short-container-title:J. Inst.

Author:

Andreotti M,Baldini W,Calabrese R,Cibinetto G,Ramusino A Cotta,Donato C De,Faccini R,Fiorini M,Luppi E,Malaguti R,Montanari A,Pietropaolo A,Santoro V,Tellarini G,Tomassetti L,Tosi N

Publisher

IOP Publishing

Subject

Mathematical Physics,Instrumentation

Link

http://stacks.iop.org/1748-0221/9/i=04/a=P04004/pdf

Reference22 articles.

1. Multi-pixel Geiger-mode avalanche photodiodes with high quantum efficiency and low excess noise factor

2. Review of displacement damage effects in silicon devices

3. Simulation of non-ionising energy loss and defect formation in silicon

4. Radiation-induced point- and cluster-related defects with strong impact on damage properties of silicon detectors

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