Radiation-induced point- and cluster-related defects with strong impact on damage properties of silicon detectors

Author:

Pintilie Ioana,Lindstroem Gunnar,Junkes Alexandra,Fretwurst Eckhart

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference72 articles.

1. F. Gianotti, M.L. Mangano, T. Virdee, Physics potential and experimental challenges of the LHC luminosity upgrade, CERN TH/2002-078, 2002.

2. X-Ray Photon Correlation Spectroscopy at the European X-Ray Free-Electron Laser (XFEL) facility

3. Radiation tolerant semiconductor sensors for tracking detectors

4. Recent results from CERN RD50 collaboration

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