A `blurred film' model in polarized light reflectometry for characterization of thick films and surface layers
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/34/i=17/a=304/pdf
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1. Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films
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