Transmittivity, reflectivities and absorptivities of a semiconductor film with a linear variation in thickness
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/28/i=6/a=029/pdf
Reference5 articles.
1. Correction method for determining the optical constants of thin films with non-uniform thickness
2. Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films
3. Reflection spectrum for a thin film with non-uniform thickness
4. Transmittance and Reflectance of Systems of Thin and Thick Layers
5. Optical constants of tin-telluride determined from infrared interference spectra
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