Monte Carlo simulation of characteristic x-ray emission from thick samples bombarded by kiloelectronvolt electrons
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/41/i=10/a=105304/pdf
Reference42 articles.
1. "Standardless" Quantitative Electron Probe Microanalysis with Energy-Dispersive X-ray Spectrometry: Is It Worth the Risk?
2. Off-axis x-ray spectra: A comparison of Monte Carlo simulated and computed x-ray spectra with measured spectra
3. Quantitative characterization of an x-ray source in an x-ray photoelectron spectroscopy system
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