Quantitative characterization of an x-ray source in an x-ray photoelectron spectroscopy system
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1150498
Reference6 articles.
1. Quantitative AES and XPS: Determination of the electron spectrometer transmission function and the detector sensitivity energy dependencies for the production of true electron emission spectra in AES and XPS
2. Effect of x‐ray flux on polytetrafluoroethylene in x‐ray photoelectron spectroscopy
3. Influence of X-Ray Solar Flare Radiation on Degradation of Teflon-laquo; in Space
4. An analytical algorithm for calculation of spectral distributions of x-ray tubes for quantitative x-ray fluorescence analysis
5. Calculation of x-ray tube spectral distributions
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