Effect of interface geometry on electron tunnelling in Al/Al2O3/Al junctions-Reference-Cited by-同舟云学术

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Effect of interface geometry on electron tunnelling in Al/Al2O3/Al junctions

Published:2016-03-21 Issue:16 Volume:49 Page:165303
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Koberidze M,Feshchenko A V,Puska M J,Nieminen R M,Pekola J P

Funder

Suomen Akatemia

European Community FP7 Marie Curie Initial Training Networks Action (ITN) Q-NET

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/49/i=16/a=165303/pdf

Reference33 articles.

1. Real-Time Observation of Discrete Andreev Tunneling Events

2. Character and fabrication of Al/Al2O3/Al tunnel junctions for qubit application

3. Initializing the flux state of multiwell inductively isolated Josephson junction qubits

4. Single-electron transistors in electromagnetic environments

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Blurred interface induced control of electrical transport properties in Josephson junctions;Scientific Reports;2024-07-27

2. First-principles studies of Schottky barriers and tunneling properties at Al(111)/Si(111) and CoSi2 (111)/Si(111) interfaces;Physical Review B;2024-07-10

3. Effect of the Al/AlO_x interfacial stacking sequence on the transport properties of alumina tunnel junctions;Physical Chemistry Chemical Physics;2023

4. Atomic and Electronic Structure of the Al₂O₃/Al Interface during Oxide Propagation Probed by Ab Initio Grand Canonical Monte Carlo;ACS Applied Materials & Interfaces;2022-09-09

5. O-terminated interface for thickness-insensitive transport properties of aluminum oxide Josephson junctions;Scientific Reports;2022-07-12

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