Determination of oxygen diffusion in the SnO2/stainless steel interface of thin films by spectrophotometric measurements-Reference-Cited by-同舟云学术

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Determination of oxygen diffusion in the SnO2/stainless steel interface of thin films by spectrophotometric measurements

Published:2016-04-20 Issue:21 Volume:49 Page:215302
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Carretero E,Alonso R,Pelayo C

Funder

Spanish MINECO

Diputación General de Aragón under FPI programme

Diputación General de Aragón and the European Social Fund

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/49/i=21/a=215302/pdf

Reference25 articles.

1. Theory of the oxidation of metals

2. Accurate depth profiling of dry oxidized SiGeC thin films by extended Full Spectrum ToF-SIMS

3. Spectrophotometric study of oxide growth on arc evaporated TiN and ZrN coatings during hot air oxidation tests

4. ToF-SIMS study of gold/phthalocyanine interface

5. Engineering of the Chemical Reactivity of the Ti/HfO2 Interface for RRAM: Experiment and Theory.

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1. Semitransparent Decorative Coatings Based on Optical Interference of Metallic and Dielectric Thin Films for High Temperature Applications;Coatings;2018-05-11

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