Development of a roughness measurement standard with irregular surface topography for improving 3D surface texture measurement-Reference-Cited by-同舟云学术

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Development of a roughness measurement standard with irregular surface topography for improving 3D surface texture measurement

Published:2009-06-30 Issue:8 Volume:20 Page:084023
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Nemoto Kentaro,Yanagi Kazuhisa,Aketagawa Masato,Yoshida Ichiro,Uchidate Michimasa,Miyaguchi Takashi,Maruyama Hideki

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Reference15 articles.

1. A Study on Surface Material Measures for Areal Surface Texture Measuring Instruments: Measuring Conditions for the Areal Profiling

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1. Correlational study of multiscale analysis and the metrological characteristics of areal surface topography measuring instruments;Surface Topography: Metrology and Properties;2024-07-08

2. Comprehensive profile and areal calibration by additively manufactured material measures;Surface Topography: Metrology and Properties;2024-02-23

3. Review of material measures for surface topography instrument calibration and performance verification;Measurement Science and Technology;2023-10-06

4. Manufacturing of Areal Material Measures;Component Surfaces;2023-09-02

5. Developmental framework of line edge roughness reference standards for next-generation functional micro-/nanostructures;Precision Engineering;2023-09

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