A method for determining the spring constant of cantilevers for atomic force microscopy
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/7/i=2/a=010/pdf
Reference17 articles.
1. Adhesion of microstructures investigated by atomic force microscopy
2. Microfabrication of cantilever styli for the atomic force microscope
3. Silicon cantilevers and tips for scanning force microscopy
4. Measurement of the intrinsic stress in thin films of silver by a new cantilevered plate technique
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