A resonant cavity for high-accuracy measurement of microwave dielectric properties
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/7/i=9/a=010/pdf
Reference10 articles.
1. Determination of semiconductor energy gaps using the microwave cavity perturbation method
2. A system to measure complex permittivity of low loss ceramics at microwave frequencies and over large temperature ranges
3. Split‐ring resonators for measuring microwave surface resistance of oxide superconductors
4. Multiple frequency surface resistance measurement technique using a multimode TE/sub 01n/ cylindrical cavity on a TlBaCaCuO superconducting film
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