A system to measure complex permittivity of low loss ceramics at microwave frequencies and over large temperature ranges
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1146518
Reference5 articles.
1. Measurement of the Dielectric Constant and Loss of Solids and Liquids by a Cavity Perturbation Method
2. The Measurement of Conductivity and Permittivity of Semiconductor Spheres by an Extension of the Cavity Perturbation Method
3. Measurement of Dielectric Parameters at Microwave Frequencies by Cavity-Perturbation Technique
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