The multi-position calibration of the stiffness for atomic-force microscope cantilevers based on vibration
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/26/i=5/a=055001/pdf
Reference25 articles.
1. Review of SI traceable force metrology for instrumented indentation and atomic force microscopy
2. A new method for the prediction of laser cut surface topography
3. A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy
4. Model for Cuboid Shape Samples and its Analysis Used for Measurements of Thermophysical Properties of Sandstone
5. Method for the calibration of atomic force microscope cantilevers
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