Development of a scanning probe microscope compact sensor head featuring a diamond probe mounted on a quartz tuning fork
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Reference16 articles.
1. Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork
2. Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy
3. Industrial Uses of STM and AFM * *Contribution of the National Institute of Standards and Technology. Not subject to copyright except for illustrations taken from other sources.
Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. High Precision and Low Force Resonant Probe Based on Quartz Tuning Fork;International Journal of Precision Engineering and Manufacturing;2023-08-07
2. A Three-Dimensional Resonant Triggering Probe for Micro-CMM;Applied Sciences;2017-04-15
3. A Scanning Probe Microscope for Surface Measurement in Nano-Scale;Journal of Nanoscience and Nanotechnology;2016-06-01
4. Improving the Lateral Resolution of Quartz Tuning Fork-Based Sensors in Liquid by Integrating Commercial AFM Tips into the Fiber End;Sensors;2015-01-14
5. Metrological scanning probe microscope based on a quartz tuning fork detector;Journal of Micro/Nanolithography, MEMS, and MOEMS;2012-03-02
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