Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy
Author:
Affiliation:
1. Experimentalphysik VI, Center for Electronic Correlations and Magnetism (EKM), Institute of Physics, University of Augsburg, 86135 Augsburg, Germany.
Abstract
Publisher
American Association for the Advancement of Science (AAAS)
Subject
Multidisciplinary
Reference22 articles.
1. G. Binnig C. F. Quate Ch. Gerber Phys. Rev. Lett. 56 930 (1986).
2. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
3. Observation of $\bf 7\times 7$ Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force Microscopy
4. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
5. Forces and frequency shifts in atomic-resolution dynamic-force microscopy
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