An analogue contact probe using a compact 3D optical sensor for micro/nano coordinate measuring machines
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/25/i=9/a=094008/pdf
Reference39 articles.
1. Development of a low-cost micro-CMM for 3D micro/nano measurements
2. Design of a High-Accuracy CMM Based on Multi-Lateration Techniques
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