Analysis of waveform distortion due to the transit time effect in stroboscopic scanning electron microscopy
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Reference17 articles.
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5. Analysis of the transit time effect on the stroboscopic voltage contrast in the scanning electron microscope
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2. High-Speed Techniques;Electron Beam Testing Technology;1993
3. Simulation des trajectoires d'électrons secondaires pour le test des circuits intégrés au microscope électronique à balayage;Journal de Physique III;1992-11
4. Transit time effect in electron beam testing voltage measurements;Measurement Science and Technology;1992-09-01
5. Electron beam testing versus laser beam testing;Microelectronic Engineering;1992-03
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