A two-axis tip tilt platform for x-ray interferometry
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Reference15 articles.
1. Scanning X-ray interferometry and the silicon lattice parameter: towards relative uncertainty?
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1. Neutron interference from a split-crystal interferometer;Journal of Applied Crystallography;2022-07-15
2. Defocused travelling fringes in a scanning triple-Laue X-ray interferometry setup;Journal of Applied Crystallography;2021-09-13
3. The Measurement of the Silicon Lattice Parameter and the Count of Atoms to Realise the Kilogram;MAPAN;2020-11-19
4. Diffraction effects in length measurements by laser interferometry;Optics Express;2016-03-15
5. The Avogadro constant determination via enriched silicon-28;Measurement Science and Technology;2009-08-21
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