Non-Linear Analysis of the Elastic Behaviour of a Translation Device for X-Ray Interferometry-Reference-Cited by-同舟云学术

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Non-Linear Analysis of the Elastic Behaviour of a Translation Device for X-Ray Interferometry

Published:1989-01-01 Issue:4 Volume:26 Page:219-227
ISSN:0026-1394
Container-title:Metrologia
language:
Short-container-title:Metrologia

Author:

Mana G,Vattaneo F,Zosi G

Publisher

IOP Publishing

Subject

General Engineering

Link

http://stacks.iop.org/0026-1394/26/i=4/a=002/pdf

Reference23 articles.

1. Determination of the Avogadro Constant

2. X-Ray to Visible Wavelength Ratios

3. Progress at IMGC in the absolute determination of the silicon d

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A two-axis tip tilt platform for x-ray interferometry;Measurement Science and Technology;2003-04-24

2. History and progress in the accurate determination of the Avogadro constant;Reports on Progress in Physics;2001-11-16

3. Simulation of the thermoelastic behavior of an LLL x-ray interferometer;Review of Scientific Instruments;2000-04

4. Simulation of Monolithic Silicon LLL Scanning X-Ray Interferometer;Japanese Journal of Applied Physics;1997-08-15

5. Scanning X-ray interferometry over a millimeter baseline;IEEE Transactions on Instrumentation and Measurement;1997-04

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