A new technique for measuring Young's modulus of electroplated nickel using AFM
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Reference18 articles.
1. Nonlinear and linearized algorithms for the Young’s modulus extraction of thin films through the capacitance-voltage measurement of microstructures
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3. The evaluation of Young's modulus and residual stress of nickel films by microbridge testings
4. A new technique for measuring the mechanical properties of thin films
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