In situenergy-dispersive x-ray diffraction system for time-resolved thin-film growth studies-Reference-Cited by-同舟云学术

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In situenergy-dispersive x-ray diffraction system for time-resolved thin-film growth studies

Published:2003-02-12 Issue:3 Volume:14 Page:336-345
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Ellmer K,Mientus R,Wei V,Rossner H

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Reference44 articles.

Cited by 37 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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4. Industry-relevant magnetron sputtering and cathodic arc ultra-high vacuum deposition system for in situ x-ray diffraction studies of thin film growth using high energy synchrotron radiation;Review of Scientific Instruments;2015-09

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